Advanced, versatile semiconductor inspection and wafer management systems.
Manufacturing equipment from steppers to the most sophisticated inspection systems has given Nikon invaluable experience in the field of microelectronics. This experience has allowed Nikon to become a worldwide leader in microelectronics technology and in the manufacture of advanced instruments designed specifically for the production and inspection of semiconductors and flat panel displays.
Products
subcategories
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NEXIV FOUP
Non-contact, fully automated wafer carrier measuring system.
Powertrain Components, Telecom & Electronics, Antennae, Automated measurement, Telescope optics, Wafers…
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Optistation-V
Compact wafer inspection solution featuring exceptional accuracy and high throughput at a modest price.
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NWL200
Advanced IC inspection wafer loader capable of loading 100µm thin wafers.
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Eclipse L200N Series
200mm wafer and mask inspection microscope systems for reflected light defect identification.
Telecom & Electronics, Antennae, Telescope optics, Wafers, Mobile phones, shavers & watches
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Eclipse LV-DAF
An upright microscope with dynamic auto-focus that brings fast, versatile focus to the Eclipse LV semiconductor inspection microscope series and OEM applications.
Telecom & Electronics, Antennae, Telescope optics, Mobile phones, shavers & watches
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Eclipse LV150N
A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields.
Telecom & Electronics, Antennae, Implants/Protheses, Telescope optics, Surface Examination, Wafers…
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Eclipse L300 Series
300mm wafer and mask inspection microscope systems for reflected light defect identification.
Telecom & Electronics, Antennae, Telescope optics, Wafers, Liquid Crystal Displays, Mobile phones, shavers & watches
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Eclipse LV150NL
A new industrial microscope designed especially for episcopic illumination applications.
Telecom & Electronics, Antennae, Telescope optics, Mobile phones, shavers & watches
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Eclipse LV150NA
Digital imaging combined with evolved optical system
