Nikon introduces new Research Stereo Microscopes SMZ25/SMZ18
May 13, 2013
Nikon Corporation (Makoto Kimura, President; Chiyoda-Ku, Tokyo,) is pleased to announce the introduction of our newest Research Stereo Microscopes SMZ25/SMZ18, featuring “the largest zoom range”1, “extremely high resolution” and “exceptionally bright Epi-fluorescence”.The SMZ25/SMZ18 is ideally suited for both industrial...
Nikon Metrology introduces new ALTERA range of CMMs
May 13, 2013
The new ALTERA range of bridge coordinate measuring machines (CMMs) from Nikon Metrology have been developed to meet the varying needs of manufacturers, both today and in the future. Improved productivity, enhanced metrology and greater flexibility are the hallmarks of this new generation of premium quality CMMs from Nik...
Nikon Metrology announces high accuracy metrology CT system
May 13, 2013
The new MCT225 HA combines more than 95 years of Nikon experience in optical metrology, 50 years of LK experience in CMM metrology and 25 years of X-Tek experience in Computed Tomography (CT). MCT225 HA – the most accurate in its class – provides high accuracy Metrology CT for a wide range of sample sizes and material de...
Nikon Metrology present latest innovations at Control focusing on productivity improvement, better insight and higher accuracy
May 13, 2013
CONTROL 2013, the international trade fair for quality assurance will be the venue for releasing new inspectio...
CAMIO7 extends probing support with high performance SP80 and enhances reporting tool
April 17, 2013
The latest CAMIO7.2 version now supports the ultra-high accuracy fixed head SP80 scanning probe. The Renishaw SP80 scanning probe achieves class-leading scanning performance and flexibility when combined with Nikon Metrology’s high quality ceramic bridge CMMs. SP80 is set to become the CMM scanning probe of choice for...
Nikon Metrology introduces the XT V 130C
March 29, 2013
A VERSATILE X-RAY INSPECTION WORKHORSE FOR ELECTRONICS QUALITY ASSURANCE FOR TODAY AND TOMORROWNikon Metrology announces the introduction of the XT V 130C, an upgradeable X-ray system that can be tailored to the users’ needs. This highly flexible electronics and semiconductor inspection system provides cost-effecti...
New case story: 3D laser scanning advances tool creation for medical components
February 22, 2013
Multi-sensor CMM cuts 35 per cent from cost of remanufacturing implant forging diesLaser scanning combined with touch probing on a Nikon Metrology co-ordinate measuring machine (CMM) fits perfectly with additive layer manufacturing (3D printing) practices at French rapid manufacturing service bureau, Applications Additiv...
Nikon announces the "NEXIV VMZ-R4540"
December 17, 2012
Nikon Corporation (Makoto Kimura, President, Tokyo) is pleased to announce the release of the CNC Video Measuring System "NEXIV VMZ-R4540," capable of accurately measuring the dimensions and shapes of high density and multi-layered electronic components....
New case story: Omco Group glass moulds produced faster and less expensively using Nikon Metrology's modern multi-sensor metrology
December 17, 2012
Omco Group, the largest manufacturer of glass container moulds in Europe, and perhaps in the world, is leading the way within its industry by using laser scanning to digitise customers’ bottle designs, shortening the lead-time from receipt of order to delivery of the finished moulds.Manufactured by Nikon Metrology, a pio...
InnovMetric Software announces that it has developed a free plug-in for the Nikon Metrology Laser Radar MV224 and MV330/350 devices
December 6, 2012
InnovMetric Software Inc. announced that it has developed a free plug-in for the Nikon Metrology Laser Radar MV224 and MV330/350 devices. Operated with PolyWorks|Inspector™, this plug-in is fully integrated into version 12.1 of PolyWorks....
