Nikon Metrology News

Nikon Mexico opens new metrology showroom

February 4, 2016

Due to increased business in Latin America, Nikon Mexico  inaugurated on January 26 a new metrology showroom in...

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Inspect-X 5.0 enables higher resolution scans for an improved insight into defects

January 26, 2016

Nikon Metrology introduces Inspect-X 5.0, the latest release of the acquisition and analysis software for Nikon Metro...

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New Case Story: New knowledge from ancient specimens using X-Ray computed tomography (CT)

January 14, 2016

X-ray computed tomography at the Smithsonian Institution’s National Museum of Natural History is delivering new knowledge from ancient specimensThe mission of the Smithsonian Institution, the world’s largest museum and research complex, is admirably brief: “The increase and diffusion of knowledge.” The vision statement,...

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New Case Story: Nikon microscope enables more efficient rock sample categorisation

December 14, 2015

CASP researchers choose “brilliant” stereomicroscope for geological research CASP is a non-profit, charitable trust ca...

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New Case Story: Open University establishes world lead in weld testing for safety-critical applications

December 7, 2015

Nikon Metrology photomicrography equipment supports high precision stress-strain analysis at elevated temperatures and under vacuum...

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Nikon Metrology announces new benchtop SEM JCM-6000Plus NeoScope™

November 30, 2015

Equipped with high-sensitivity semiconductor detector, delivering Fast and efficient analysisThe new benchtop scanning electron microscope, JCM-6000Plus NeoScope™, is designed to fulfill the diversifying needs of customers. The JCM-6000Plus is the third generation of the popular NeoScope benchtop SEM designed for conveni...

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New Case Story: Faster inspection and reporting with 3D laser scanning

October 19, 2015

Automotive and aerospace pressings specialist invests in bridge-type and portable arm CMMs for freeform surface data acquisition...

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New Case Story: Rugby Worldcup trophy within the eye of a needle

October 7, 2015

At the occasion of the 2015 Rugby World cup in England, the microscopy artist Willard Wigan from Birmingham (UK) created a hand-sculpted trophy that fits inside the eye of a needle. This remarkable micro-sculpture is submillimetre in size.  To closely watch his micro-scale movements while working, the artist uses a...

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Groundbreaking CMM-Manager 3.5 software now available for Nikon Metrology iNexiv Vision Measuring Equipment

September 23, 2015

Nikon Metrology announces CMM-Manager 3.5 for Nikon’s iNexiv vision measuring equipment. With a powerful and user-fri...

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New Case Story: Nikon metrology addresses the challenges of inspecting graphene

August 26, 2015

In recognition of the importance of graphene, the new wonder material that is ultra-light and flexible yet 200 times...

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Aug 20, 2015 New Case Story: Studio takes photomicrographs of minerals to produce stunning art
Jul 9, 2015 New Case Story: Subcontractor upgrades metrology department and offers service to other manufacturers
Jun 5, 2015 Nikon Metrology Laser Radar, the next-generation CMM for shop floor automotive BIW inspection
May 29, 2015 ALTO CMM provides unequalled price/ performance for a wide range of inspection tasks
May 7, 2015 Nikon InSight L100, the ultimate CMM laser scanner combining productivity and accuracy
Apr 22, 2015 New Case Story: Nikon’s VMA System Speeds Inspection by a Factor of 60
Jan 21, 2015 New Case Story: Nikon’s VMZ-R System Ensures Diamond Quality for Waterjets
Jan 20, 2015 New Case Story: Foam gaskets seals in the line of fire
Dec 15, 2014 New Case Story: Spring S.r.l. uses laser scanner for quality control of additively manufactured products
Nov 28, 2014 New Case Story: Prototype parts in the focus of Quality Assurance
Nov 11, 2014 X.Tract provides deeper insight in multi-layer PCB assemblies and complex electronic components
Nov 7, 2014 New Case Story: Printed circuit board manufacturer embraces X-ray inspection for next-generation devices
Sep 25, 2014 New Case Story: X-ray inspection shifts a gear higher at SGC - SwitchGear Company
Sep 18, 2014 Inspect-X 4.1 provides ultra-sharp images and advanced BGA analysis
Sep 11, 2014 Measuretec becomes Benelux sales and service partner for Video Measuring systems and measuring microscopes
Aug 13, 2014 Nikon BW-Series White Light Interferometric Microscope System
Jun 20, 2014 New Case Story: First teaching laboratory in Denmark with scanning electron microscopes
Jun 12, 2014 New Case Story: High voltage CT system advances inspection of automotive turbochargers
Jun 4, 2014 New Case Story: Laser scanners replace tactile probing for body-in-white inspection at FIAT-TOFAS
May 28, 2014 World's first 750kV microfocus X-ray source for NDT inspection and measurement of high density parts
May 22, 2014 DS-Ri2 and DS-Qi2, microscopy digital cameras equipped with a Nikon digital SLR camera FX-format CMOS sensor optimized for microscopy
May 20, 2014 Unique high voltage 450 kV microfocus CT system for inspection of dense or large parts
May 16, 2014 New Case Story: Laser Radar for automated inline inspection
May 4, 2014 Nikon Metrology presents NanoFocus X-ray inspection system for the most demanding electronics applications
Apr 22, 2014 New stereo microscopes SMZ1270/SMZ1270i and SMZ800N feature enhanced optical performance and operation
Apr 15, 2014 New Case Story: High resolution CT scanning to shed new light on human evolution
Apr 3, 2014 New Case Story: High accuracy horizontal arm CMM inspects next-generation automotive fixtures
Mar 21, 2014 New Case Story: X-Ray Computed Tomography expands horizons of anthropology at Duke university
Mar 10, 2014 New iNEXIV VMA-4540 video measuring systems for precise inspection of larger samples
Jan 21, 2014 New case story: In-process X-ray inspection improves quality control of circuit boards - and cut costs
Nov 29, 2013 Leonardo 3D Metrology becomes exclusive reseller in Italy
Nov 29, 2013 University of Leuven applies metrology CT to research geometrical accuracy of inner and outer features of industrial components
Nov 11, 2013 New case story: Scanning electron microscope for world-class facility developing next-generation ceramics
Sep 25, 2013 Nikon introduces the “NEXIV VMZ-R3020” and “NEXIV VMZ-R6555”
Sep 17, 2013 Mena3D becomes Nikon Metrology exclusive reseller for Middle-East and North-Africa
Sep 10, 2013 CAMIO8 multi-sensor CMM software provides better insights and more productivity
Jul 15, 2013 New case story: Laser scanning opens new business opportunities at diecasting company
Jun 13, 2013 New case story: Automated nikon photo-microscope supports world-leading rock analysis
May 13, 2013 Nikon introduces new Research Stereo Microscopes SMZ25/SMZ18
May 13, 2013 Nikon Metrology introduces new ALTERA range of CMMs
May 13, 2013 Nikon Metrology announces high accuracy metrology CT system
May 13, 2013 Nikon Metrology present latest innovations at Control focusing on productivity improvement, better insight and higher accuracy
Apr 17, 2013 CAMIO7 extends probing support with high performance SP80 and enhances reporting tool
Mar 29, 2013 Nikon Metrology introduces the XT V 130C
Feb 22, 2013 New case story: 3D laser scanning advances tool creation for medical components
Dec 17, 2012 Nikon announces the "NEXIV VMZ-R4540"
Dec 17, 2012 New case story: Omco Group glass moulds produced faster and less expensively using Nikon Metrology's modern multi-sensor metrology
Dec 6, 2012 InnovMetric Software announces that it has developed a free plug-in for the Nikon Metrology Laser Radar MV224 and MV330/350 devices
Sep 27, 2012 Nikon introduces ECLIPSE LV-N Series industrial microscopes
Sep 25, 2012 Nikon introduces CFI60-2 Objective Series for industrial microscopes
Sep 10, 2012 Nikon Metrology introduces premium portable scanning solution featuring new MCAx articulated arm and ModelMaker MMDx/MMCx scanners
May 7, 2012 Nikon Metrology announces new metrology CT system
May 7, 2012 Nikon Metrology extends its multi-sensor support to include Renishaw's REVO probe
May 7, 2012 Nikon Metrology presents Metrology CT and other innovations in non-contact measurement technology at Control 2012
Feb 29, 2012 Nikon LC15Dx scanner closes the gap with tactile probe accuracy
Dec 15, 2011 Nikon Metrology Focus 10 brings CMM and handheld scanning experience to a higher level
Nov 22, 2011 New X-ray research centre at Southampton University equipped with Nikon Metrology Systems
Nov 10, 2011 Nikon ShuttlePix receives "iF design award 2012"
Sep 5, 2011 Necsa opens up South African research opportunities with microfocus Nikon Metrology X-ray and CT system
Jun 7, 2011 Geomagic and Nikon Metrology Partner to Offer Integrated Scanning Solution for 3D Reverse Engineering and Inspection
Apr 29, 2011 Nikon Metrology demonstrates complete laser scanner portfolio at Control 2011
Apr 28, 2011 CMM inspection is faster and easier with Nikon Metrology CAMIO7
Apr 28, 2011 CMM inspection is faster and easier with Nikon Metrology CAMIO7
Apr 12, 2011 HN-6060 True multi-sensor 3D metrology system sets new standards for non-contact inspection of complex shapes
Apr 12, 2011 iSpace for archeology turns your excavation area into a metrology lab
Feb 3, 2011 Nikon Metrology and Deva integrate Focus Scan with Deva CMM controller
Jan 26, 2011 CMM-Manager 3.0 features new Windows 7 style user interface
Jan 24, 2011 Nikon introduces new stereoscopic microscope SMZ745
Jan 12, 2011 Nikon Metrology incorporates Inspect-X and CT-Pro into XT software Suite v2.2
Nov 25, 2010 Nikon Metrology introduces ShuttlePix, a digital microscope with the ease-of-use and portability of a digital camera
Oct 14, 2010 Slashing inspection time with Laser Radar MV330/350
Sep 8, 2010 Rapidform to interface directly with Nikon Metrology handheld laser scanners
Aug 12, 2010 New Case Story: Precision Engineering Company Invests Shrewdly, Competes Globally
Jul 16, 2010 Nikon Confocal NEXIV VMZ-K6555 Provides New Measurement Possibilities for Demanding Applications
Jul 15, 2010 Nikon Metrology announces availability of Optelics H1200 Real Color Confocal Microscope
Jul 13, 2010 Nikon Metrology enhances observation performance and operation with introduction of Eclipse L300N/L300ND
Sep 8, 2009 Nikon launches specially designed cost-effective episcopic industrial microscope
Aug 26, 2009 Leading materials analysis manufacturer to supply Nikon microscopes
May 26, 2009 NeoScope Benchtop SEM voted European Best New Lab Product 2008
Apr 1, 2009 Nikon launches new economical yet accurate measuring microscope
Mar 2, 2009 NeoScope benchtop SEM featured on UK stand for first time at MedTec/MTEC UK
Jan 4, 2008 Multi-sensor measurement system exhibited at MedTec UK for the first time
Nov 28, 2007 Nikon LV-100 microscope helps uncover the secrets of our solar system

Nikon Metrology R&D projects