Nikon Metrology News

New Case Story: X-ray inspection shifts a gear higher at SGC - SwitchGear Company

September 25, 2014

SGC - SwitchGear Company has installed a Microfocus CT system from Nikon Metrology to accelerate product development and to maintain high quality standards for incoming components from suppliers. The 225 kV X-ray equipment is installed on the production floor and is used to non-destructively inspect the quality of variou...

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Inspect-X 4.1 provides ultra-sharp images and advanced BGA analysis

September 18, 2014

Inspect-X 4.1, the latest release of the acquisition and analysis software for Nikon Metrology’s range of X-ray and CT systems, provides improved real-time imaging and advanced BGA analysis. The C.Clear real-time image enhancements provide easy-to-interpret images for fast online defect recognition. The new image process...

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Measuretec becomes Benelux sales and service partner for Video Measuring systems and measuring microscopes

September 11, 2014

Nikon Metrology is happy to announce a new cooperation with Measuretec in Netherlands. Measuretec is since 2007 active in video measurement business and becomes the Nikon Metrology sales and service partner for the NEXIV systems and measuring microscopes in Benelux. Based in Tilburg, Measuretec is centrally located to se...

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Nikon BW-Series White Light Interferometric Microscope System

August 13, 2014

Building on Nikon’s Industry leading Double Beam Interferometry objectives, Nikon Metrology has launched a series of White Light Interferometry (WLI) Systems, which will set a new the standard in 2D and 3D surface profiling....

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New Case Story: First teaching laboratory in Denmark with scanning electron microscopes

June 20, 2014

Five Nikon Metrology SEMs will attract hundreds more students every year with the aim of promoting physics and nanotechnology...

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New Case Story: High voltage CT system advances inspection of automotive turbochargers

June 12, 2014

Computed Tomography transforms automotive turbocharger R&D at BorgWarner by non-destructively inspecting components and assemblies...

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New Case Story: Laser scanners replace tactile probing for body-in-white inspection at FIAT-TOFAS

June 4, 2014

Turkish automotive manufacturer FIAT-Tofaş is implementing new inspection methodologies for their diagnostic measurements of sheet metal components and body-in-white (BIW) assemblies. A key element involves the installation of Nikon Metrology XC65Dx-LS Cross Scanners and CAMIO multi-sensor metrology software, which...

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World's first 750kV microfocus X-ray source for NDT inspection and measurement of high density parts

May 28, 2014

Nikon Metrology announces a unique 750 kV X-ray source with micron level spot size. This high power X-ray source enables non-destructive inspection or measurement of large or dense objects such as engine castings, turbine blades, large composite parts with unprecedented resolution. It is the only 750 kV microfocus source...

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DS-Ri2 and DS-Qi2, microscopy digital cameras equipped with a Nikon digital SLR camera FX-format CMOS sensor optimized for microscopy

May 22, 2014

Nikon Metrology is pleased to announce the release of digital cameras for microscopes DS-Ri2 and DS-Qi2. These are the first Nikon digital cameras for microscopes in the Digital Sight series equipped with a Nikon FX-format CMOS sensor. They offer 16.25-megapixel high-definition images. The DS-Ri2 provides superior color...

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Unique high voltage 450 kV microfocus CT system for inspection of dense or large parts

May 20, 2014

The XT H 450 sets a new reference for turbine blade measurement and non-destructive testing and inspection of steel or aluminum cast parts. At the core of this powerful equipment is the in-house designed 450kV microfocus source. It is the only 450 kV microfocus source on the market providing superior resolution and accur...

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May 16, 2014 New Case Story: Laser Radar for automated inline inspection
May 4, 2014 Nikon Metrology presents NanoFocus X-ray inspection system for the most demanding electronics applications
Apr 22, 2014 New stereo microscopes SMZ1270/SMZ1270i and SMZ800N feature enhanced optical performance and operation
Apr 15, 2014 New Case Story: High resolution CT scanning to shed new light on human evolution
Apr 3, 2014 New Case Story: High accuracy horizontal arm CMM inspects next-generation automotive fixtures
Mar 21, 2014 New Case Story: X-Ray Computed Tomography expands horizons of anthropology at Duke university
Mar 10, 2014 New iNEXIV VMA-4540 video measuring systems for precise inspection of larger samples
Jan 21, 2014 New case story: In-process X-ray inspection improves quality control of circuit boards - and cut costs
Nov 29, 2013 Leonardo 3D Metrology becomes exclusive reseller in Italy
Nov 29, 2013 University of Leuven applies metrology CT to research geometrical accuracy of inner and outer features of industrial components
Nov 11, 2013 New case story: Scanning electron microscope for world-class facility developing next-generation ceramics
Sep 25, 2013 Nikon introduces the “NEXIV VMZ-R3020” and “NEXIV VMZ-R6555”
Sep 17, 2013 Mena3D becomes Nikon Metrology exclusive reseller for Middle-East and North-Africa
Sep 10, 2013 CAMIO8 multi-sensor CMM software provides better insights and more productivity
Jul 15, 2013 New case story: Laser scanning opens new business opportunities at diecasting company
Jun 13, 2013 New case story: Automated nikon photo-microscope supports world-leading rock analysis
May 13, 2013 Nikon introduces new Research Stereo Microscopes SMZ25/SMZ18
May 13, 2013 Nikon Metrology introduces new ALTERA range of CMMs
May 13, 2013 Nikon Metrology announces high accuracy metrology CT system
May 13, 2013 Nikon Metrology present latest innovations at Control focusing on productivity improvement, better insight and higher accuracy
Apr 17, 2013 CAMIO7 extends probing support with high performance SP80 and enhances reporting tool
Mar 29, 2013 Nikon Metrology introduces the XT V 130C
Feb 22, 2013 New case story: 3D laser scanning advances tool creation for medical components
Dec 17, 2012 Nikon announces the "NEXIV VMZ-R4540"
Dec 17, 2012 New case story: Omco Group glass moulds produced faster and less expensively using Nikon Metrology's modern multi-sensor metrology
Dec 6, 2012 InnovMetric Software announces that it has developed a free plug-in for the Nikon Metrology Laser Radar MV224 and MV330/350 devices
Sep 27, 2012 Nikon introduces ECLIPSE LV-N Series industrial microscopes
Sep 25, 2012 Nikon introduces CFI60-2 Objective Series for industrial microscopes
Sep 10, 2012 Nikon Metrology introduces premium portable scanning solution featuring new MCAx articulated arm and ModelMaker MMDx/MMCx scanners
May 7, 2012 Nikon Metrology announces new metrology CT system
May 7, 2012 Nikon Metrology extends its multi-sensor support to include Renishaw's REVO probe
May 7, 2012 Nikon Metrology presents Metrology CT and other innovations in non-contact measurement technology at Control 2012
Feb 29, 2012 Nikon LC15Dx scanner closes the gap with tactile probe accuracy
Dec 15, 2011 Nikon Metrology Focus 10 brings CMM and handheld scanning experience to a higher level
Nov 22, 2011 New X-ray research centre at Southampton University equipped with Nikon Metrology Systems
Nov 10, 2011 Nikon ShuttlePix receives "iF design award 2012"
Sep 5, 2011 Necsa opens up South African research opportunities with microfocus Nikon Metrology X-ray and CT system
Jun 7, 2011 Geomagic and Nikon Metrology Partner to Offer Integrated Scanning Solution for 3D Reverse Engineering and Inspection
Apr 29, 2011 Nikon Metrology demonstrates complete laser scanner portfolio at Control 2011
Apr 28, 2011 CMM inspection is faster and easier with Nikon Metrology CAMIO7
Apr 28, 2011 CMM inspection is faster and easier with Nikon Metrology CAMIO7
Apr 12, 2011 HN-6060 True multi-sensor 3D metrology system sets new standards for non-contact inspection of complex shapes
Apr 12, 2011 iSpace for archeology turns your excavation area into a metrology lab
Feb 3, 2011 Nikon Metrology and Deva integrate Focus Scan with Deva CMM controller
Jan 26, 2011 CMM-Manager 3.0 features new Windows 7 style user interface
Jan 24, 2011 Nikon introduces new stereoscopic microscope SMZ745
Jan 12, 2011 Nikon Metrology incorporates Inspect-X and CT-Pro into XT software Suite v2.2
Nov 25, 2010 Nikon Metrology introduces ShuttlePix, a digital microscope with the ease-of-use and portability of a digital camera
Oct 14, 2010 Slashing inspection time with Laser Radar MV330/350
Sep 8, 2010 Rapidform to interface directly with Nikon Metrology handheld laser scanners
Aug 12, 2010 New Case Story: Precision Engineering Company Invests Shrewdly, Competes Globally
Jul 16, 2010 Nikon Confocal NEXIV VMZ-K6555 Provides New Measurement Possibilities for Demanding Applications
Jul 15, 2010 Nikon Metrology announces availability of Optelics H1200 Real Color Confocal Microscope
Jul 13, 2010 Nikon Metrology enhances observation performance and operation with introduction of Eclipse L300N/L300ND
Sep 8, 2009 Nikon launches specially designed cost-effective episcopic industrial microscope
Aug 26, 2009 Leading materials analysis manufacturer to supply Nikon microscopes
May 26, 2009 NeoScope Benchtop SEM voted European Best New Lab Product 2008
Apr 1, 2009 Nikon launches new economical yet accurate measuring microscope
Mar 2, 2009 NeoScope benchtop SEM featured on UK stand for first time at MedTec/MTEC UK
Jan 4, 2008 Multi-sensor measurement system exhibited at MedTec UK for the first time
Nov 28, 2007 Nikon LV-100 microscope helps uncover the secrets of our solar system

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