Smaller, cheaper, faster - these are the ever-present concerns of microelectronic device manufacturers. In this industry, each new generation of products must outperform its predecessors while in smaller package sizes and without a significant increase in costs.
These manufacturing rules also affect each of the components involved in their fabrication including
As the size of these devices continues to decrease, so does the need for increasingly powerful measurement techniques rise to analyze ever more densely populated circuit boards. At smaller scales, the effect of every imperfection becomes magnified, while new design complications, such as electrostatic forces, begin to have a measurable impact on performance.
To monitor the quality of design and production in this environment, a combination of microscopy systems is often used. Included among these are:
• stereomicroscopy and optical light microscopy or general fault finding and the inspection of bonds;
• transmitted and reflected light metallurgical microscopy for wafer inspection; and video measuring systems for detailed metrology analysis and reporting;
• wafer and mask inspection microscope system for reflected light defect identification
The addition of high resolution digital cameras and intuitive yet powerful analysis software can further improve quality control, helping manufacturers to be ready for the production of the next generation of chips and even greater engineering requirements.
Key techniques and instruments: stereomicroscopy, transmitted and reflected light illumination, inverted microscopes, video measuring systems, digital cameras, NIS-Elements.
High-speed, high accuracy benchtop digital metrology and imaging system.
Affordable, small-size benchtop system (150x150mmx150mm stage).
A stereomicroscope optical powerhouse, with a 15:1 zoom ratio and high N.A.’s producing high-contrast, tack-sharp images.
Affordable workhorse stereomicroscope with 6:3 zoom ratio and 4x to 300x magnification range.
Stereomicroscope featuring a 6.3:1 zoom ratio, ergonomic design, and impressive expansion options.
Stereomicroscope with a 10:1 zoom ratio, superb optical performance and advanced ergonomics.
A new zoom microscope solution for macro imaging applications for biomedical and industrial markets.
A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields.
Compact and affordable measuring microscope system featuring exceptional quality, accuracy and durability.
High precision measuring microscopes featuring the latest in digital imaging technology.
Powerful and easy-to-use measuring and inspection software platform for Nikon NEXIV vision systems.
Trinocular stereoscopic microscope ideally suited for observation and digital imaging. Features an impressive 7.5x zoom range.
The XT V 160 is specifically designed for x-ray inspection in production lines and failure analysis laboratories.
Compact XT V 130 QA-system for affordable X-ray visualization and automated inspection