Nikon Metrology / Products / Semiconductor Systems / Semiconductor Microscopes / Eclipse LV150N

Nikon Eclipse LV150N Industrial Microscopes

Overview

Digital imaging combined with advanced optical system

Eclipse LV150N

A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm.

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Categories: Semiconductor Microscopes

Applications: Surface Examination, MEMS, Fabrics/Textiles, Optoelectronics, Composites, Telescope optics, Antennae, Mobile phones, shavers & watches , Telecom & Electronics, Implants/ Protheses, Metal Manufacturing, Wafers, Liquid Crystal Displays, Microelectronics, Metallurgy

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