Nikon Metrology / Products / Semiconductor Systems / Semiconductor Microscopes / Eclipse LV150N

Nikon Eclipse LV150N Industrial Microscopes

Overview

Digital imaging combined with advanced optical system

Eclipse LV150N

A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm.

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Categories: Semiconductor Microscopes

Applications: Fabrics/Textiles, Composites, Metallurgy, Optoelectronics, Telecom & Electronics, Microelectronics, Liquid Crystal Displays, Telescope optics, Metal Manufacturing, Wafers, MEMS, Surface Examination, Antennae, Implants/ Protheses, Mobile phones, shavers & watches

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