Nikon Metrology News

New Case Story: Prototype parts in the focus of Quality Assurance

November 28, 2014

Laser scanner operation at automotive supplier Kiekert AGThe dimensional evaluation of prototype parts is integral to the actual serial production. However, depending on material consistency, traditional tactile measurement cannot provide the necessary integrated overall view of measured components. For this reason, Kiek...

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New Case Story: Printed circuit board manufacturer embraces X-ray inspection for next-generation devices

November 7, 2014

Nikon Metrology X-ray machine cuts the price of placing BGA devices by 70 per centSubcontract manufacturers of printed circuit board assemblies (PCBAs) for applications such as electric motorbike control, ground movement detection and touch-sensitive sound generation, generally use a number of different tools for quality...

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New Case Story: X-ray inspection shifts a gear higher at SGC - SwitchGear Company

September 25, 2014

SGC - SwitchGear Company has installed a Microfocus CT system from Nikon Metrology to accelerate product development and to maintain high quality standards for incoming components from suppliers. The 225 kV X-ray equipment is installed on the production floor and is used to non-destructively inspect the quality of variou...

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Inspect-X 4.1 provides ultra-sharp images and advanced BGA analysis

September 18, 2014

Inspect-X 4.1, the latest release of the acquisition and analysis software for Nikon Metrology’s range of X-ray and CT systems, provides improved real-time imaging and advanced BGA analysis. The C.Clear real-time image enhancements provide easy-to-interpret images for fast online defect recognition. The new image process...

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Nikon BW-Series White Light Interferometric Microscope System

August 13, 2014

Building on Nikon’s Industry leading Double Beam Interferometry objectives, Nikon Metrology has launched a series of White Light Interferometry (WLI) Systems, which will set a new the standard in 2D and 3D surface profiling....

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3D Engineering Solutions Forms Partnership with Nikon Metrology to Create an Industrial CT Scanning Center of Excellence

July 11, 2014

3D Engineering Solutions (3DES), an advanced design engineering and metrology services company in Cincinnati, Ohio is pleased to announce their strategic partnership with Nikon Metrology, Inc (NMI) of Brighton, Michigan. 3DES recently purchased two state of the art industrial computed tomography (CT) systems from NMI. Th...

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New Case Story: First teaching laboratory in Denmark with scanning electron microscopes

June 20, 2014

Five Nikon Metrology SEMs will attract hundreds more students every year with the aim of promoting physics and nanotechnology...

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New Case Story: High voltage CT system advances inspection of automotive turbochargers

June 12, 2014

Computed Tomography transforms automotive turbocharger R&D at BorgWarner by non-destructively inspecting components and assemblies...

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New Case Story: Laser scanners replace tactile probing for body-in-white inspection at FIAT-TOFAS

June 4, 2014

Turkish automotive manufacturer FIAT-Tofaş is implementing new inspection methodologies for their diagnostic measurements of sheet metal components and body-in-white (BIW) assemblies. A key element involves the installation of Nikon Metrology XC65Dx-LS Cross Scanners and CAMIO multi-sensor metrology software, which...

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World's first 750kV microfocus X-ray source for NDT inspection and measurement of high density parts

May 28, 2014

Nikon Metrology announces a unique 750 kV X-ray source with micron level spot size. This high power X-ray source enables non-destructive inspection or measurement of large or dense objects such as engine castings, turbine blades, large composite parts with unprecedented resolution. It is the only 750 kV microfocus source...

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May 22, 2014 DS-Ri2 and DS-Qi2, microscopy digital cameras equipped with a Nikon digital SLR camera FX-format CMOS sensor optimized for microscopy
May 20, 2014 Unique high voltage 450 kV microfocus CT system for inspection of dense or large parts
May 16, 2014 New Case Story: Laser Radar for automated inline inspection
May 4, 2014 Nikon Metrology presents NanoFocus X-ray inspection system for the most demanding electronics applications
Apr 22, 2014 Stereo Microscope SMZ1270/SMZ1270i and SMZ800N with enhanced optical performance and operation
Apr 15, 2014 New Case Story: High resolution CT scanning to shed new light on human evolution
Apr 3, 2014 New Case Story: High accuracy horizontal arm CMM inspects next-generation automotive fixtures
Mar 21, 2014 New Case Story: X-Ray Computed Tomography expands horizons of anthropology at Duke university
Mar 10, 2014 New iNEXIV VMA-4540 video measuring systems for precise inspection of larger samples
Jan 21, 2014 New case story: In-process X-ray inspection improves quality control of circuit boards - and cut costs
Nov 29, 2013 University of Leuven applies metrology CT to research geometrical accuracy of inner and outer features of industrial components
Nov 11, 2013 New case story: Scanning electron microscope for world-class facility developing next-generation ceramics
Sep 25, 2013 Nikon introduces the “NEXIV VMZ-R3020” and “NEXIV VMZ-R6555”
Sep 10, 2013 CAMIO8 multi-sensor CMM software provides better insights and more productivity
Jul 15, 2013 New case story: Laser scanning opens new business opportunities at diecasting company
Jun 13, 2013 New case story: Automated nikon photo-microscope supports world-leading rock analysis
May 13, 2013 Nikon Metrology announces high accuracy metrology CT system
May 13, 2013 Nikon introduces new Research Stereo Microscopes SMZ25/SMZ18
May 13, 2013 Nikon Metrology introduces new ALTERA range of CMMs
Jan 24, 2013 Nikon Metrology's Laser Radar integrates with Metrologic Group's Metrolog X4, advancing the technology to new heights
Dec 6, 2012 InnovMetric Software announces that it has developed a free plug-in for the Nikon Metrology Laser Radar MV224 and MV330/350 devices
Sep 10, 2012 Nikon Metrology introduces premium portable scanning solution featuring new MCAx articulated arm and ModelMaker MMDx/MMCx scanners
Jul 10, 2012 New JCM-6000 NeoScope II with higher magnification and multi-touch screen control, and a sleek new design
Feb 29, 2012 Nikon LC15Dx scanner closes the gap with tactile probe accuracy
Dec 15, 2011 Nikon Metrology Focus 10 brings CMM and handheld scanning experience to a higher level
Nov 22, 2011 New X-ray research centre at Southampton University equipped with Nikon Metrology Systems
Nov 10, 2011 Nikon ShuttlePix receives "iF design award 2012"
Sep 5, 2011 Necsa opens up South African research opportunities with microfocus Nikon Metrology X-ray and CT system
Jun 7, 2011 Geomagic and Nikon Metrology Partner to Offer Integrated Scanning Solution for 3D Reverse Engineering and Inspection
Apr 29, 2011 Nikon Metrology demonstrates complete laser scanner portfolio at Control 2011
Apr 28, 2011 CMM inspection is faster and easier with Nikon Metrology CAMIO7
Apr 12, 2011 HN-6060 True multi-sensor 3D metrology system sets new standards for non-contact inspection of complex shapes
Apr 12, 2011 iSpace for archeology turns your excavation area into a metrology lab
Feb 3, 2011 Nikon Metrology and Deva integrate Focus Scan with Deva CMM controller
Jan 26, 2011 CMM-Manager 3.0 features new Windows 7 style user interface
Jan 24, 2011 Nikon introduces new stereoscopic microscope SMZ745
Jan 12, 2011 Nikon Metrology incorporates Inspect-X and CT-Pro into XT software Suite v2.2
Nov 25, 2010 Nikon Metrology introduces ShuttlePix, a digital microscope with the ease-of-use and portability of a digital camera
Oct 14, 2010 Slashing inspection time with Laser Radar MV330/350
Sep 8, 2010 Rapidform to interface directly with Nikon Metrology handheld laser scanners
Sep 8, 2010 Nikon Instruments Announces Popular Vote for 2010 Nikon Small World Competition
Jul 16, 2010 Nikon Confocal NEXIV VMZ-K6555 Provides New Measurement Possibilities for Demanding Applications
Jul 13, 2010 Nikon Metrology enhances observation performance and operation with introduction of Eclipse L300N/L300ND
Apr 30, 2010 Nikon Instruments Announces 2010 Nikon Small World Judges
Apr 1, 2010 Nikon Forms Nikon Metrology, Inc. for Industrial-Based Metrology Customer
Mar 24, 2010 Nikon Small World Call For Entries Deadline April 30th
Jan 20, 2010 Nikon Instruments And The Wistar Institute Present Small World Exhibition And Microscopy Seminars
Oct 1, 2009 Nikon Introduces Software Upgrade for iNexiv Multi-Sensor Measuring System
Oct 1, 2009 Nikon Introduces BW-H501 High-Speed, High-Precision 3D Surface Profile System
Sep 22, 2009 Nikon Instruments Welcomes Metris to the Nikon Corporate Family
Aug 20, 2009 New Inspection Microscope Offers Improved Observation and Imaging
Aug 12, 2009 Nikon Instruments' New SMZ-745T Line of Stereo Microscopes Offers Highest Zoom Magnification in its Class
Aug 5, 2009 Nikon Instruments Opens Online Game With Winning Small World Images
Aug 1, 2009 Nikon Instruments' New MM-200 Measuring Microscope Combines Precision and Accuracy in Compact, Space-Saving Body
Apr 28, 2009 Nikon Instruments Announces Judges for Nikon Small World
Mar 31, 2009 Nikon Small World Entry Deadline is April 30th
Oct 16, 2008 Marine Diatoms Capture Top Honors at Nikon Small World 2008
Sep 10, 2008 Nikon Introduces Inverted Materials Microscope, Eclipse MA200
Sep 8, 2008 New Digital CAD Overlay Brings Easy Visualization to Nikon's iNexiv VMA Automeasure Software
Jul 15, 2008 Nikon Instruments Introduces New Microscopes and Illumination Stand for Education and OEM Markets
Jul 15, 2008 Nikon's New Wafer Loader NWL200 Series Is the First Ever Capable of Loading Wafers as Thin as 100 Micrometers
Jul 15, 2008 Nikon Instruments Introduces LV-DAF for Full System Integration with Eclipse LV Microscope Series
Jul 15, 2008 Nikon's New WES-3000 Wafer Edge Inspection Tool Offers High-Throughput, In-Line Inspection With High-Resolution
Jul 15, 2008 Nikon's New APM-3000 Series Fills Gap Between CD SEM and OCD Semiconductor Inspection Devices
May 27, 2008 Nikon Instruments Receives Record Number of Entries for Nikon Small World
Mar 27, 2008 Nikon Small World Entry Deadline Is April 30th
Oct 5, 2007 Mouse Embryo Captures Top Honors At Nikon Small World
Oct 5, 2007 Crystallized Solgel Chemical Takes Top Prize in the Nikon Small World Popular Vote
Sep 28, 2007 Nikon's iNEXIV Multi-Sensor Measuring System Now Offers Touch Probe Technology
Aug 7, 2007 Nikon Announces New Versatile, Universal Design Microscope
Jul 10, 2007 Nikon Instruments Opens Judging Of This Year's Nikon Small World Competition To The Public For The First Time
Jan 16, 2007 Nikon's New iNEXIV Multi-Sensor Measuring System Offers 3D Image Documentation
Oct 30, 2006 Nikon's New Eclipse MA100 Inverted Metallurgical Microscope Delivers Rapid Production Inspection Capability
Oct 13, 2006 Nikon Enhances Its LiveScan Swept Field Confocal Microscope
Oct 13, 2006 Nikon Introduces the AZ100 Multizoom Microscope
Oct 13, 2006 Nikon's New NIS-Elements V2.3 Speeds Image Acquisition and Enhances Analysis Capability
Sep 25, 2006 Nikon Announces NIS-Elements Documentation Software
Sep 25, 2006 Nikon Revamps E-MAX Software
Sep 25, 2006 Nikon Expands its 'Digital Sight' Line of Advanced Digital Camera Imaging Systems
Sep 25, 2006 Nikon Seamlessly Integrates Digital Imaging With Industrial Metrology
Sep 12, 2006 Nikon's Small World Winning Images Exhibit at the National Academy of Sciences
May 16, 2006 Nikon Announces NIS-Elements Documentation Software
May 2, 2006 Nikon Instruments Unveils Judges for 32nd International Small World Competition
Nov 7, 2005 Nikon's New NIS-Elements Software Delivers Scalable Functionality - Setting New Industry Benchmarks
Oct 18, 2005 Nikon's Small World Calendar Showcasing Amazing Photomicrographs Is Now Available
Oct 6, 2005 Common Housefly Soars to First Place at Nikon's Small World
Jul 20, 2005 Nikon Instruments Announces Judges for 31st International Small World Competition
Jul 12, 2005 Nikon's Confocal NEXIV Delivers a New Dimension in IC Metrology
Jun 20, 2005 Nikon Expands Its Eclipse Line Of Industrial Microscope Imaging Solutions
Apr 18, 2005 Nikon Introduces NEXIV VMR LU Series Measuring System
Apr 18, 2005 Nikon Expands its 'Digital Sight' Line of Advanced Digital Camera Imaging Systems
Jan 24, 2005 Nikon Integrates Industrial Microscopy and Metrology Organizations
Oct 11, 2004 Nikon Instruments Announces Record Sales of Its NRM-3100 Overlay Inspection Measurement System
Oct 6, 2004 Nanotechnology Makes a Small World Even Smaller
Sep 16, 2002 Nikon Instruments, Inc. Creates New Business Divisions
Jun 27, 2002 Nikon Names Hiro Kusaka as President & CEO of Nikon Instruments, Inc.
Jan 30, 2002 Nikon IC Inspection Microscopes Attachment Offers Outstanding Optics and Real Time Confocal Imaging
Jul 18, 2001 Optistation-3000 Series Offers High-Precision, Ultra-Fast Inspection For 300MM Wafers
Apr 24, 2001 Nikon NEXIV VM-1000 3D Video Measuring Instrument Allows Measurement of More Parts Without Loading or Unloading
Apr 24, 2001 Nikon NEXIV VMH-300 Video Measuring Instrument Provides High Speed, High Accuracy, 3D Metrology
Apr 24, 2001 Nikon Introduces Improved Video Measuring Instruments with Increased Speed, Accuracy and Illumination
Apr 16, 2001 Nikon Introduces Eclipse ME600L Industrial Microscope Offering Flexible Illumination Options
Apr 9, 2001 Nikon Introduces Eclipse L150 and 150A Industrial Microscope For Materials Science Applications
Mar 30, 2001 New Study Finds That Use of Ergonomic Microscopes Can Reduce Risk of Workplace Injury, Benefiting Users
Jul 28, 2000 Nikon Introduces SMZ1500 Stereo Microscope with Highest Optical Performance, Largest Zoom Range Available
Jul 10, 2000 Nikon Introduces Video Measuring Instruments With High Speed, High Accuracy, High Intelligence
May 18, 2000 Nikon Sells 300mm Semiconductor Inspection Stations

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